Developments in lightwave S-parameter measurement techniques

被引:1
|
作者
Pollard, RD [1 ]
机构
[1] Univ Leeds, Sch Elect & Elect Engn, Inst Microwaves & Photon, Leeds LS2 9JT, W Yorkshire, England
关键词
D O I
10.1049/ip-smt:20020763
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The state-of-the-art in lightwave network analysis is reviewed. Existing commercial instruments use simple architectures which limit the type of calibrations that are available for lightwave S-parameter measurements. However, recent research at The University of Leeds has demonstrated the feasibility of using reversible test sets and modular approaches, which offer the option of full two-post self-calibration routines for the first time. Experimental results for the error-corrected S-parameter measurement of optical, optoelectronic and electro-optic two-ports are presented.
引用
收藏
页码:345 / 350
页数:6
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