Comparison of S-Parameter Measurement Methods for Adapters

被引：2

作者：

Kuhlmann, Karsten ^{[1
]}

Gellersen, Frauke ^{[1
]}

Tschauder, Meike ^{[1
]}

机构：

[1] Phys Tech Bundesanstalt PTB, High Frequency & Electromagnet Fields, Bundesallee 100, D-38116 Braunschweig, Germany

来源：

ADVANCES IN RADIO SCIENCE | 2023年 / 20卷

关键词：

Scattering parameters;

D O I：

10.5194/ars-20-1-2023

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this work two methods for the characterization of adapters meaning reciprocal two-ports with different connector styles on both ports are analyzed and compared in detail. The focus is on the comparison of these approaches in terms of required effort and obtained measurement uncertainty. The first method is based on two one-port calibrations and it is compared to a two-port approach. Both methods are carried out in simulation as well as in measurement under very comparable conditions using a 2.4 to 3.5mm adapter in the frequency range up to 33GHz as an example. The obtained measurement uncertainties of the results are presented and analyzed, the required measurement time in terms of the necessary number of separate connections is compared, and the influence of cable movements is discussed.

引用

页码：1 / 8

页数：8

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