Electrical switching life of vacuum circuit breaker interrupters

被引：7

作者：

Slade, Paul G. ^{[1
]}

Smith, R. Kirkland ^{[1
]}

机构：

[1] Vacuum Interrupter Technol, Eaton Elect, Horseheads, NY USA

来源：

PROCEEDINGS OF THE FIFTY-SECOND IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS | 2006年

关键词：

component; vacuum interrupters; electrical switching life; arcing erosion of contacts;

D O I：

10.1109/HOLM.2006.284061

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Experiments were performed to determine the electrical life of a vacuum interrupter as a function of current. The test currents ranged from the normal load currents of 630A (rms) to 3150A (rms) to higher currents of 20% to 100% of the rated short-circuit current. The two vacuum interrupter contact styles were evaluated: the transverse magnetic field (TNF) contact and the axial magnetic field structure (AMF). For the short-circuit current switching the ANN contact shows a longer electrical life, but the erosion may not be the only limitation on the life of the vacuum interrupter. The results will be discussed in terms of the expected performance of the two contact designs and on the operating life of a vacuum interrupter.

引用

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页码：32 / +

页数：2

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