Highly Efficient Color Separation and Focusing in the Sub-micron CMOS Image Sensor

被引:5
|
作者
Yun, Seokho [1 ]
Roh, Sookyoung [1 ]
Lee, Sangyun [1 ]
Park, Hongkyu [1 ]
Lim, Minwoo [1 ]
Ahn, Sungmo [1 ]
Choo, Hyuck [1 ]
机构
[1] Samsung Adv Inst Technol, Suwon, Gyeonggi Do, South Korea
关键词
D O I
10.1109/IEDM19574.2021.9720592
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report nanoscale metaphotonic color-routing (MPCR) structure that can significantly improve the low-light performance of a sub-micron CMOS image sensor. Fabricated on the Samsung's commercial 0.8 mu m-pixel sensor, MPCR structures separate the incident light energy into appropriate color pixels at high efficiency, yielding increased quantum efficiency up to +20%. Our experimental demonstration confirms a luminance SNR improvement of +1.22 dB under low light condition of 5 lux, accompanied with a comparably low color reproduction error and great angular tolerant response.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] Demonstration of sub-micron UCN position resolution using room-temperature CMOS sensor
    Lin, S.
    Baldwin, J. K.
    Blatnik, M.
    Clayton, S. M.
    Cude-Woods, C.
    Currie, S. A.
    Filippone, B.
    Fries, E. M.
    Geltenbort, P.
    Holley, A. T.
    Li, W.
    Liu, C. -Y.
    Makela, M.
    Morris, C. L.
    Musedinovic, R.
    O'Shaughnessy, C.
    Pattie, R. W., Jr.
    Salvat, D. J.
    Saunders, A.
    Sharapov, E. I.
    Singh, M.
    Sun, X.
    Tang, Z.
    Uhrich, W.
    Wei, W.
    Wolfe, B.
    Young, A. R.
    Wang, Z.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2023, 1057
  • [22] Area- and energy-efficient CORDIC accelerators in deep sub-micron CMOS technologies
    Vishnoi, U.
    Noll, T. G.
    [J]. ADVANCES IN RADIO SCIENCE, 2012, 10 : 207 - 213
  • [23] Switching response modeling of the CMOS inverter for sub-micron devices
    Bisdounis, L
    Nikolaidis, S
    Koufopavlou, O
    Goutis, C
    [J]. DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, 1998, : 729 - 735
  • [24] Soft error rate estimation in deep sub-micron CMOS
    Zeng, Lianlian
    Beckett, Paul
    [J]. 13TH PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING, PROCEEDINGS, 2007, : 210 - 216
  • [25] Investigation on metal pillar defect in sub-micron CMOS technology
    You, Young Seon
    Kim, Nam Sung
    Yew, Wong Wing
    Ho, Eng Keong
    Chua, Chun Peng
    Lee, Yang Bum
    Se, Kwang Leong
    Son, Dong Ju
    Shukla, Dhruva
    Mukhopadhyay, M.
    Pey, Kin San
    [J]. ISSM 2006 CONFERENCE PROCEEDINGS- 13TH INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING, 2006, : 443 - 446
  • [26] A new linearity measurement algorithm for sub-micron microwave CMOS
    Choi, WY
    Choi, BY
    Woo, DS
    Lee, JD
    Park, BG
    [J]. IMTC/O3: PROCEEDINGS OF THE 20TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1 AND 2, 2003, : 374 - 376
  • [27] Process factors in the reduction of output conductance in sub-micron CMOS
    May, NC
    Tan, HS
    Kordesch, AV
    [J]. NSTI NANOTECH 2004, VOL 1, TECHNICAL PROCEEDINGS, 2004, : 477 - 480
  • [28] Assessing SRAM test coverage for sub-micron CMOS technologies
    Kim, V
    Chen, T
    [J]. 15TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1997, : 24 - 30
  • [29] A sub-micron CMOS programmable charge pump for implantable pacemaker
    Novo, A
    Gerosa, A
    Neviani, A
    [J]. ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2001, 27 (03) : 211 - 217
  • [30] Robust design of deep sub-micron CMOS wireless SoC
    Hamada, Mototsugu
    Itoh, Nobuyuki
    [J]. 2008 IEEE RADIO AND WIRELESS SYMPOSIUM, VOLS 1 AND 2, 2008, : 61 - 64