Optimisation of the digital image correlation technique and measurement of strain in first level C4 interconnect

被引：0
|
作者：
Kehoe, Liam [1 ]
Kelly, Patrick V. [1 ]
Guenebaut, Vincent [1 ]
机构：
[1] Opt Metrol Innovat Ltd, 2200 Cork Airport Business Pk, Cork, Ireland
来源：
IEEE CPMT: INTERNATIONAL SYMPOSIUM AND EXHIBITION ON ADVANCED PACKAGING MATERIALS: PROCESSES, PROPERTIES AND INTERFACES | 2006年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：155 / +
页数：2
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