Experimental results for high-speed jitter measurement technique

被引：0

作者：

Taylor, K ^{[1
]}

Nelson, B ^{[1
]}

Chong, A ^{[1
]}

Nguyen, H ^{[1
]}

Lin, H ^{[1
]}

Soma, M ^{[1
]}

Haggag, H ^{[1
]}

Huard, J ^{[1
]}

Braatz, J ^{[1
]}

机构：

[1] Univ Washington, Dept Elect Engn, Seattle, WA 98195 USA

来源：

INTERNATIONAL TEST CONFERENCE 2004, PROCEEDINGS | 2004年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A BIST method to measure jitter without external references is presented. Measured data from 0.25-mum BiCMOS chips show jitter resolution about 30 to 50 ps over 8 cycles of a I GHz input signal.

引用

页码：85 / 94

页数：10

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