Domain wall characterization in ferroelectrics by using localized nonlinearities
被引:61
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作者:
Deng, Xuewei
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Shanghai Jiao Tong Univ, Dept Phys, State Key Lab Fiber Opt Local Area Commun Network, Shanghai 200240, Peoples R ChinaShanghai Jiao Tong Univ, Dept Phys, State Key Lab Fiber Opt Local Area Commun Network, Shanghai 200240, Peoples R China
Deng, Xuewei
[1
]
Chen, Xianfeng
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机构:
Shanghai Jiao Tong Univ, Dept Phys, State Key Lab Fiber Opt Local Area Commun Network, Shanghai 200240, Peoples R ChinaShanghai Jiao Tong Univ, Dept Phys, State Key Lab Fiber Opt Local Area Commun Network, Shanghai 200240, Peoples R China
Chen, Xianfeng
[1
]
机构:
[1] Shanghai Jiao Tong Univ, Dept Phys, State Key Lab Fiber Opt Local Area Commun Network, Shanghai 200240, Peoples R China
In this paper, a method of domain wall characterization in ferroelectrics through Cherenkov second harmonic generation by localized nonlinearities is proposed. By this method, domain wall width is estimated to be less than 10nm. High spatial angular resolution of about 10mrad in the experiment reveals the fine structures of the domain walls. Combined with scanning techniques, this method can reconstruct domain wall patterns with high resolution. This method has advantages of being nondestructive, noncontact, in situ as well as of high resolution. (C) 2010 Optical Society of America