Probing tunneling spin injection into graphene via bias dependence

被引:9
|
作者
Zhu, Tiancong [1 ]
Singh, Simranjeet [1 ]
Katoch, Jyoti [1 ]
Wen, Hua [2 ]
Belashchenko, Kirill [3 ,4 ]
Zutic, Igor [5 ]
Kawakami, Roland K. [1 ,2 ]
机构
[1] Ohio State Univ, Dept Phys, 174 W 18th Ave, Columbus, OH 43210 USA
[2] Univ Calif Riverside, Dept Phys & Astron, Riverside, CA 92521 USA
[3] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
[4] Univ Nebraska, Nebraska Ctr Mat & Nanosci, Lincoln, NE 68588 USA
[5] SUNY Buffalo, Dept Phys, Buffalo, NY 14260 USA
基金
美国国家科学基金会;
关键词
DER-WAALS HETEROSTRUCTURES; ROOM-TEMPERATURE; TRANSPORT; SPINTRONICS; SEMICONDUCTORS; RELAXATION; LIFETIMES; DEVICES; SINGLE;
D O I
10.1103/PhysRevB.98.054412
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The bias dependence of spin injection in graphene lateral spin valves is systematically studied to determine the factors affecting the tunneling spin injection efficiency. Three types of junctions are investigated, including MgO and hexagonal boron nitride (hBN) tunnel barriers and direct contacts. A dc bias current applied to the injector electrode induces a strong nonlinear bias dependence of the nonlocal spin signal for both MgO and hBN tunnel barriers. Furthermore, this signal reverses its sign at a negative dc bias for both kinds of tunnel barriers. The analysis of the bias dependence for injector electrodes with a wide range of contact resistances suggests that the sign reversal correlates with bias voltage rather than current. We consider different mechanisms for nonlinear bias dependence and conclude that the energy-dependent spin-polarized electronic structure of the ferromagnetic electrodes, rather than the electrical field-induced spin drift effect or spin filtering effect of the tunnel barrier, is the most likely explanation of the experimental observations.
引用
收藏
页数:7
相关论文
共 50 条
  • [21] Abnormal bias dependence of magnetoresistance in CoFeB/MgO/Si spin-injection tunnel contacts
    Park, June-Young
    Baek, Seung-heon Chris
    Park, Seung-Young
    Jo, Younghun
    Park, Byong-Guk
    APPLIED PHYSICS LETTERS, 2015, 107 (18)
  • [22] Tunneling injection temperature dependence in EEPROM cell
    Zahi, Y.
    Laffont, R.
    Lalande, F.
    Boutahar, S.
    Bouchakour, R.
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2007, 353 (5-7) : 648 - 652
  • [23] Bias-dependent spin injection into graphene on YIG through bilayer hBN tunnel barriers
    Leutenantsmeyer, Johannes Christian
    Liu, Tian
    Gurram, Mallikarjuna
    Kaverzin, Alexey A.
    van Wees, Bart J.
    PHYSICAL REVIEW B, 2018, 98 (12)
  • [24] Probing an Individual Electron Spin State in a Quantum Dot with Spin Bias
    Yin, Haitao
    Li, Zhongqiu
    Feng, Lifeng
    Xue, Huijie
    Li, Hua
    Liu, Xiaojie
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2018, 18 (03) : 2096 - 2099
  • [25] Detection of spin injection efficiency by tunneling magnetoresistance
    Ma, J
    Sun, J
    Wang, J
    MODERN PHYSICS LETTERS B, 2004, 18 (10): : 411 - 418
  • [26] Frequency dependence of magnetoimpedance in spin tunneling junctions
    Kaiju, H
    Shiiki, K
    Fujita, S
    Morozumi, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (03): : 1246 - 1249
  • [27] Probing Electron Spin Resonance in Monolayer Graphene
    Lyon, T. J.
    Sichau, J.
    Dorn, A.
    Centeno, A.
    Pesquera, A.
    Zurutuza, A.
    Blick, R. H.
    PHYSICAL REVIEW LETTERS, 2017, 119 (06)
  • [28] Enhanced Spin Injection in Molecularly Functionalized Graphene via Ultrathin Oxide Barriers
    Toscano-Figueroa, J. C.
    Natera-Cordero, N.
    Bandurin, D. A.
    Anderson, C. R.
    Guarochico-Moreira, V. H.
    Grigorieva, I., V
    Vera-Marun, I. J.
    PHYSICAL REVIEW APPLIED, 2021, 15 (05)
  • [29] Probing the electronic structure of graphene near and far from the Fermi level via planar tunneling spectroscopy
    Davenport, John L.
    Ge, Zhehao
    Liu, Junyan
    Nunez-Lobato, Carlos
    Moon, Seongphill
    Lu, Zhengguang
    Quezada-Lopez, Eberth A.
    Hellier, Kaitlin
    LaBarre, Patrick G.
    Taniguchi, Takashi
    Watanabe, Kenji
    Carter, Sue
    Ramirez, Arthur P.
    Smirnov, Dmitry
    Velasco, Jairo, Jr.
    APPLIED PHYSICS LETTERS, 2019, 115 (16)
  • [30] Influence of the interface structure on the bias dependence of tunneling magnetoresistance
    Heiliger, C
    Zahn, P
    Yavorsky, BY
    Mertig, I
    PHYSICAL REVIEW B, 2005, 72 (18)