Electrostrictive and piezoelectric behavior of PMN-PT thin films

被引：4

作者：

Detalle, M.

Herdier, R.

Wang, G. S.

Remiens, D.

Roussel, P.

Fribourg-Blanc, E.

机构：

[1] Univ Sci & Tech Lille Flandres Artois, IEMN, DOAE, MIMM, F-59652 Villeneuve Dascq, France

[2] Off Natl Etud & Rech Aerosp, F-59045 Lille, France

[3] Chinese Acad Sci, Shanghai Inst Ceram, Lab Ferroelect Ceram & Applicat, Res Ctr Informat Funct Mat & Devices, Shanghai 200050, Peoples R China

[4] Univ Sci & Tech Lille Flandres Artois, ENSCL, CNRS UMR 8181, UCCS,Equipe Chim Solide, F-59652 Villeneuve Dascq, France

[5] CEA, LETI, F-38054 Grenoble 9, France

来源：

FERROELECTRICS | 2007年 / 351卷

关键词：

relaxor ferroelectric; piezoelectricity; electrostriction; thin films;

D O I：

10.1080/00150190701351873

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The piezoelectric and elestrostrictive properties of (1-x)PMN-(x)PTthinfilms with compositions 90110 and 70130 have been investigated. These materials exhibit mostly electrostrictive and piezoelectric behaviour in bulk materials. It is demonstrated that with conventional annealing the pure perovskite phase is realised at very low temperature (400 degrees C) for both compositions. The effect of x on properties of (1-x)PMN-xPT thin films elaborated at optimal annealed temperature (600 degrees C) is reported. We show that electromechanical response is a mixing of electrostrictive and piezoelectric response for the two compositions. However as it is readily understood, piezoelectric contribution is larger for 70/30.

引用

页码：15 / +

页数：13

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