Ultrafast conductivity and lattice dynamics of insulator-metal phase transition in VO2 studied via multi-terahertz spectroscopy

被引：0
|
作者：
Kuebler, C. [1 ]
Ehrke, H. [1 ]
Leitenstorfer, A. [1 ]
Lopez, R. [2 ,3 ]
Halabica, A. [2 ,3 ]
Haglund, R. F., Jr. [2 ,3 ]
机构：
[1] Univ Konstanz, Fachbereich Phys, D-78457 Constance, Germany
[2] Vanderbilt Univ, Dept Phys & Astron, Nashville, TN 37235 USA
[3] Vanderbilt Univ, Vanderbilt Inst Nanoscale Sci & Engn, Nashville, TN 37235 USA
来源：
CONFERENCE DIGEST OF THE 2006 JOINT 31ST INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 14TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS | 2006年
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暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The mid-infrared ultrafast response of VO2 thin films following 10 fs interband excitation is investigated as a function of sample temperature and laser fluence. The dynamics of the terahertz conductivity provides an insight into the microscopic details of the phase transition.
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页码：554 / 554
页数：1
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