Measuring of Dielectric Properties by Microstrip Resonators in the GHz Frequency

被引:0
|
作者
Rovensky, Tibor [1 ]
Pietrikova, Alena [1 ]
Vehec, Igor [1 ]
Kmec, Martin [2 ]
机构
[1] Tech Univ Kosice, Dept Elect Technol, Kosice, Slovakia
[2] Ilmenau Univ Technol, Dept Elect Measurement Res Lab, Ilmenau, Germany
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents analysis of four different (Rogers RO3003C, Rogers RO4403C, Rogers RT/duroid 5880, Rogers RT/duroid RO6010LM) Printed Circuit Boards (PCB) from the dielectric properties point of view in High Frequency (HF) area. Measuring of dielectric properties is provided by ring resonator and T-resonator. Both resonators are designed by self-created software tool and these microstrip structures are applied on PCB by common etching process. Microstrip resonators are designed to provide numerous data points over a broad frequency range. Fabricated resonators are measured by combination of Vector Network Analyser (VNA) and test probe station. Measured scattering parameters are used as input parameters for calculating dielectric constant and Q factor of measured dielectric substrate. Determined dielectric properties are plotted in graphs in frequency range from 1 GHz to 10 GHz.
引用
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页码:192 / 196
页数:5
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