Calibration and matching of floating gate devices

被引：0

作者：

Millard, WP ^{[1
]}

Kalayjian, ZK ^{[1
]}

Andreou, AG ^{[1
]}

机构：

[1] Johns Hopkins Univ, Dept Elect & Comp Engn, Baltimore, MD 21211 USA

来源：

ISCAS 2000: IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - PROCEEDINGS, VOL IV: EMERGING TECHNOLOGIES FOR THE 21ST CENTURY | 2000年

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We measure the matching characteristics of floating gate MOSFET devices. Arrays of ten FG PFET devices were fabricated on two different runs of the same process. Matching characteristics were measured: 1) direct from the foundry, 2) after Fowler-Nordheim tunneling, 3) after self-limiting PFET hot-electron injection, and 4) after UV exposure. We also found significant threshold voltage drift in long-term memory tests.

引用

页码：389 / 392

页数：4

共 50 条

[1] Gate oxide leakage and floating gate capacitor matching test
Tian, Weidong
Trogolo, Joe
Todd, Bob
Hutter, Lou
2007 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, PROCEEDINGS, 2007, : 120 - +
[2] Floating gate devices: Operation and compact modeling
Pavan, P
Larcher, L
Marmiroli, A
NSTI NANOTECH 2004, VOL 2, TECHNICAL PROCEEDINGS, 2004, : 120 - 123
[3] Floating-gate devices, circuits, and systems
Hasler, P
FIFTH INTERNATIONAL WORKSHOP ON SYSTEM-ON-CHIP FOR REAL-TIME APPLICATIONS, PROCEEDINGS, 2005, : 482 - 487
[4] Computing with Novel Floating-Gate Devices
Schinke, Daniel
Di Spigna, Neil
Shiveshwarkar, Mihir
Franzon, Paul
COMPUTER, 2011, 44 (02) : 29 - 36
[5] A FLOATING GATE AND ITS APPLICATION TO MEMORY DEVICES
KAHNG, D
SZE, SM
BELL SYSTEM TECHNICAL JOURNAL, 1967, 46 (06): : 1288 - +
[6] Leakage current and floating gate capacitor matching test
Tian, Weidong
Trogolo, Joe R.
Todd, Bob
IEICE TRANSACTIONS ON ELECTRONICS, 2008, E91C (08) : 1315 - 1320
[7] The floating gate measurement technique for characterization of capacitor matching
Tuinhout, HP
Elzinga, H
Brugman, JT
Postma, F
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1996, 9 (01) : 2 - 8
[8] Floating gate measurement technique for characterization of capacitor matching
Philips Research Lab, Eindhoven, Netherlands
IEEE Trans Semicond Manuf, 1 (2-8):
[9] Calibration of Floating-Gate SoC FPAA System
Kim, Sihwan
Shah, Sahil
Hasler, Jennifer
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017, 25 (09) : 2649 - 2657
[10] Partial breakdown of the tunnel oxide in floating gate devices
Fu, KY
SOLID-STATE ELECTRONICS, 1997, 41 (05) : 774 - 777

← 1 2 3 4 5 →