Application of Spectral Statistics to Surface Defect Detection

被引：0

作者：

Deborah, Hilda ^{[1
]}

Richard, Noel ^{[2
]}

Hardeberg, Jon Yngve ^{[1
]}

机构：

[1] Norwegian Univ Sci & Technol, Dept Comp Sci, Trondheim, Norway

[2] Univ Poitiers, CNRS, JRU 7252, Lab XLIM, Poitiers, France

来源：

FOURTEENTH INTERNATIONAL CONFERENCE ON QUALITY CONTROL BY ARTIFICIAL VISION | 2019年 / 11172卷

关键词：

D O I：

10.1117/12.2521714

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The development of a spectral difference-based statistical processing of hyperspectral images is provided in this article. Kullback-Leibler pseudo-divergence function, which was specifically developed for the metrological processing of hyperspectral images, is used at the foundation of the statistics. As a demonstration of its use, the proposed statistics are used in visualising surface variability within a set of pigment patches. It is then further exploited to detect anomalies and deterioration that occur on the patches.

引用

页数：8

共 50 条

[21] HOT SURFACE DEFECT DETECTION DEVICE
ISHIWATARI, H
[J]. TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1985, 71 (05): : S399 - S399
[22] Detection of a small defect on a rough surface
Gu, ZH
[J]. OPTICS LETTERS, 1998, 23 (07) : 494 - 496
[23] Application of FPGA embedded image processing system in surface defect detection for steel plate
Hu, L
Duan, FJ
Ye, SH
[J]. PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON INSTRUMENTATION SCIENCE AND TECHNOLOGY, VOL 2, 2004, : 531 - 535
[24] Research on the Application of Steel Plate Surface Defect Detection System Based on Machine Vision
Liu, Xianfeng
[J]. PROCEEDINGS OF THE 2016 2ND INTERNATIONAL CONFERENCE ON MATERIALS ENGINEERING AND INFORMATION TECHNOLOGY APPLICATIONS (MEITA 2016), 2017, 107 : 244 - 248
[25] Detection of a small defect on a rough surface
Surface Optics Corporation, 11555 Rancho Bernardo Road, San Diego, CA 92127, United States
[J]. Opt. Lett., 7 (494-496):
[26] An Efficient Network for Surface Defect Detection
Lin, Zesheng
Ye, Hongxia
Zhan, Bin
Huang, Xiaofeng
[J]. APPLIED SCIENCES-BASEL, 2020, 10 (17):
[27] A novel approach to surface defect detection
Da, Yihui
Dong, Guirong
Wang, Bin
Liu, Dianzi
Qian, Zhenghua
[J]. INTERNATIONAL JOURNAL OF ENGINEERING SCIENCE, 2018, 133 : 181 - 195
[28] Application of Spectral Detection Technology in Drug Detection
Wei, Chun-Sheng
Li, Qi-Feng
Ma, Xiang-Yun
Yang, Yun-Peng
[J]. Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis, 2024, 44 (11): : 3001 - 3007
[29] Interference Spectral Imaging Based on Liquid Crystal Relaxation and Its Application in Optical Component Defect Detection
Yuan, Jiajia
Fan, Wei
Cheng, He
Huang, Dajie
Du, Tongyao
[J]. APPLIED SCIENCES-BASEL, 2022, 12 (02):
[30] Defect Detection of IC Wafer Based on Spectral Subtraction
Liu, Hongxia
Zhou, Wen
Kuang, Qianwei
Cao, Lei
Gao, Bo
[J]. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2010, 23 (01) : 141 - 147

← 1 2 3 4 5 →