Complexes, clustering, and native-defect-assisted diffusion of aluminum in silicon

被引:8
|
作者
Schirra, P
Lopez, GM
Fiorentini, V
机构
[1] Univ Cagliari, INFM, SLACS, Sardinian Lab Computat Mat Sci, I-09042 Monserrato, CA, Italy
[2] Univ Cagliari, Dipartimento Fis, I-09042 Monserrato, CA, Italy
关键词
D O I
10.1103/PhysRevB.70.245201
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We study from first principles the energetics, complex formation, and diffusion of Al in crystalline Si. We first consider the interaction of Al with self-interstitials Si-i: at variance with B and In, the complex formed by substitutional Al-Si and a self-interstitial Si-i is metastable and trasforms into interstitial Al-i in the tetrahedral site. Therefore in the presence of excess self-interstitials Si-i, Al will go off-site and cease to be an acceptor. Al-i can then bind to Al-Si, forming a trigonal complex (also not an acceptor) compatible with the properties of the Si-G19 center. A further sizable energy gain is obtained forming the deep-donor Al-Al-self-interstitial complex. We thus predict that a sufficiently high externally generated Si-i population will cause the deactivation, and presumably the clustering and disordering, of the Al acceptor in Si. As to Al-vacancy interaction, Al-Si and a first-neighbor Si vacancy spontaneously form a divacancy-interstitial complex, similarly to In. We evaluate the activation energy for diffusion for the various mechanisms investigated, and find it to be predominantly interstitial-assisted; calculated activation energies are in good general agreement with experiment.
引用
收藏
页码:1 / 7
页数:7
相关论文
共 50 条
  • [1] The structure and properties of (aluminum, oxygen) defect complexes in silicon
    Shi, Tingting
    Yin, Wan-Jian
    Wu, Yelong
    Al-Jassim, Mowafak
    Yan, Yanfa
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 114 (06)
  • [2] Anomalous energetics and defect-assisted diffusion of Ga in silicon
    Melis, C
    Lopez, GM
    Fiorentini, V
    [J]. APPLIED PHYSICS LETTERS, 2004, 85 (21) : 4902 - 4904
  • [3] FORMATION OF DEFECT COMPLEXES AS A RESULT OF STIMULATED DIFFUSION OF PHOSPHORUS IN SILICON
    GAPONOV, SV
    KALYAGIN, MA
    STRIKOVSKII, MD
    [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1987, 21 (09): : 993 - 996
  • [4] Fluorine in Si: Native-defect complexes and the suppression of impurity diffusion
    Lopez, GM
    Fiorentini, V
    Impellizzeri, G
    Mirabella, S
    Napolitani, E
    [J]. PHYSICAL REVIEW B, 2005, 72 (04):
  • [5] DIFFUSION OF SILICON IN ALUMINUM
    FUJIKAWA, SI
    HIRANO, KI
    FUKUSHIMA, Y
    [J]. METALLURGICAL TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 1978, 9 (12): : 1811 - 1815
  • [6] SILICON DIFFUSION IN ALUMINUM
    PACCAGNELLA, A
    OTTAVIANI, G
    FABBRI, P
    FERLA, G
    QUEIROLO, G
    [J]. THIN SOLID FILMS, 1985, 128 (3-4) : 217 - 223
  • [7] ON DIFFUSION OF ALUMINUM INTO SILICON
    KAO, YC
    [J]. ELECTROCHEMICAL TECHNOLOGY, 1967, 5 (3-4): : 90 - &
  • [8] DEFECT CLUSTERING IN SILICON EMITTER JUNCTIONS
    ANDERSSON, GI
    ENGSTROM, O
    [J]. JOURNAL OF APPLIED PHYSICS, 1990, 68 (12) : 6434 - 6441
  • [9] DIFFUSION AND INCORPORATION OF ALUMINUM IN SILICON
    RAICHOUDHURY, P
    SELIM, FA
    TAKEI, WJ
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (05) : 762 - 766
  • [10] Diffusion of magnesium and silicon into aluminum
    Freche, HR
    [J]. TRANSACTIONS OF THE AMERICAN INSTITUTE OF MINING AND METALLURGICAL ENGINEERS, 1936, 122 : 324 - 336