Use of VCSEL arrays for parallel optical interconnects

被引：12
|
作者：
Lebby, M [1 ]
Gaw, CA [1 ]
Jiang, WB [1 ]
Kiely, PA [1 ]
Shieh, CL [1 ]
Claisse, PR [1 ]
Ramdani, J [1 ]
Hartman, DH [1 ]
Schwartz, DB [1 ]
Grula, J [1 ]
机构：
[1] MOTOROLA INC,PHOTON TECHNOL CTR,TEMPE,AZ 85284
来源：
FABRICATION, TESTING, AND RELIABILITY OF SEMICONDUCTOR LASERS | 1996年 / 2683卷
关键词：
VCSELs; laser reliability; laser degradation; ESD; dark line defects; parallel optical interconnect; DBR; electroluminescence;
D O I：
10.1117/12.237679
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：81 / 91
页数：11
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