Atomic force microscopy of starch systems

被引:22
|
作者
Zhu, Fan [1 ]
机构
[1] Univ Auckland, Sch Chem Sci, Private Bag 92019, Auckland 1142, New Zealand
关键词
Atomic force microscopy; starch; structure; surface; processing; structure-property relationship; SURFACE-MORPHOLOGY; MAIZE STARCH; PEA STARCH; POTATO STARCH; VISCOELASTIC PROPERTIES; GRANULE ARCHITECTURE; INCLUSION COMPLEXES; CONTROLLED-RELEASE; AMYLOSE; AFM;
D O I
10.1080/10408398.2015.1094650
中图分类号
TS2 [食品工业];
学科分类号
0832 ;
摘要
Atomic force microscopy (AFM) generates information on topography, adhesion, and elasticity of sample surface by touching with a tip. Under suitable experimental settings, AFM can image biopolymers of few nanometers. Starch is a major food and industrial component. AFM has been used to probe the morphology, properties, modifications, and interactions of starches from diverse botanical origins at both micro- and nano-structural levels. The structural information obtained by AFM supports the blocklet structure of the granules, and provides qualitative and quantitative basis for some physicochemical properties of diverse starch systems. It becomes evident that AFM can complement other microscopic techniques to provide novel structural insights for starch systems.
引用
收藏
页码:3127 / 3144
页数:18
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