A sensitive near-field microscope for thermal radiation

被引：62

作者：

Kajihara, Yusuke ^{[1
,2
]}

Kosaka, Keishi ^{[1
]}

Komiyama, Susumu ^{[1
]}

机构：

[1] Univ Tokyo, Dept Basic Sci, Meguro Ku, Tokyo 1538902, Japan

[2] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 03期

基金：

日本科学技术振兴机构;

关键词：

heat radiation; optical microscopes; phototransistors; SCANNING OPTICAL MICROSCOPE; TIP;

D O I：

10.1063/1.3360826

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.

引用

页数：4

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