A sensitive near-field microscope for thermal radiation

被引:62
|
作者
Kajihara, Yusuke [1 ,2 ]
Kosaka, Keishi [1 ]
Komiyama, Susumu [1 ]
机构
[1] Univ Tokyo, Dept Basic Sci, Meguro Ku, Tokyo 1538902, Japan
[2] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 03期
基金
日本科学技术振兴机构;
关键词
heat radiation; optical microscopes; phototransistors; SCANNING OPTICAL MICROSCOPE; TIP;
D O I
10.1063/1.3360826
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.
引用
收藏
页数:4
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