Fowler-Nordheim tunneling in electromigrated break junctions with porphyrin molecules

被引：12

作者：

Noguchi, Yutaka ^{[1
]}

Nagase, Takashi ^{[1
]}

Ueda, Rieko ^{[1
]}

Kamikado, Toshiya ^{[1
]}

Kubota, Tohru ^{[1
]}

Mashiko, Shinro ^{[1
]}

机构：

[1] Kobe Adv ICT Res Ctr, Natl Inst Informat & Commun Technol, Nishi Ku, Kobe, Hyogo 6512492, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 4B期

关键词：

Fowler-Nordheim tunneling; nanogap electrode; molecular junction; porphyrin;

D O I：

10.1143/JJAP.46.2683

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We measured the current-voltage (I-V) curves of 158 electromigrated break junctions with a Co(II) complex of tetraphenylporphyrin derivative (CoBSTBPP) at a temperature of 11 K within the applied bias <= 1.0 V. Symmetry I-V curves were observed in 18.4% of the measured junctions, and we found that Fowler-Nordheim tunneling is dominant in most of these junctions. The tunneling barrier height estimated from these I-V curves was smaller than 0.5 eV, which could be explained by considering the energy levels in CoBSTBPP and the Fermi level of an electrode. We conclude that CoBSTBPP forms the small tunneling barrier height in the molecular junctions.

引用

页码：2683 / 2686

页数：4

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