Nanocrystalline cobalt-based films with high thermal stability from a single molecule

被引:8
|
作者
Henderson, Lucas B. [1 ]
Rivers, Joseph H. [2 ]
Bost, Daniel E. [1 ]
Jones, Richard A. [2 ]
Ekerdt, John G. [1 ]
机构
[1] Univ Texas Austin, Dept Chem Engn, Austin, TX 78712 USA
[2] Univ Texas Austin, Dept Chem & Biochem, Austin, TX 78712 USA
来源
基金
美国国家科学基金会;
关键词
P THIN-FILMS; MAGNETIC-PROPERTIES; CO-P; ELECTROLESS DEPOSITION; SPUTTERED CO; MICROSTRUCTURE; EVOLUTION; ELECTRODEPOSITION; DIFFUSION; ALLOYS;
D O I
10.1116/1.3264480
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Thin nanocrystalline hcp Co-based films are grown by chemical vapor deposition on SiO2. Tetrakis (trimethylphosphine)cobalt(0), ((CH3)(3)P)(4)Co, is a single-source precursor that forms Co films that incorporate both P and C when the substrate temperature ranges from 225 to 325 degrees C, and feature crystallites sized < 15 nm. The P within the deposited film is mostly elemental with some being phosphidic, and the C exists mostly in the carbidic form along with some being graphitic. The Co is correspondingly predominantly metallic. Upon annealing to 400 degrees C for 3 h, some extent of both Co2P crystallite precipitation and minimal allotropic transformation to fcc Co is observed, and the amount of carbidic C is reduced relative to graphitic C, but the nanocrystalline microstructure of the film is preserved, still primarily composed of hcp Co-based crystallites. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3264480]
引用
收藏
页码:54 / 60
页数:7
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