Cluster ion emission in the interaction of slow highly charged ions with surfaces

被引：36
|
作者：
Schenkel, T [1 ]
Barnes, AV [1 ]
Hamza, AV [1 ]
Schneider, DH [1 ]
机构：
[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
来源：
EUROPEAN PHYSICAL JOURNAL D | 1998年 / 1卷 / 03期
关键词：
D O I：
10.1007/s100530050096
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Cluster ion emission from a variety of surfaces upon impact of highly charged ions is investigated by time-of-flight secondary ion mass spectrometry. The yield of cluster ions as a function of cluster size for SiO2 and C-84 surface follow a power law decline with exponent approaching the -2 limit of the "equilibrium': and "shock wave" cluster emission models. While the decline of the cluster ion emission with cluster size is an exponential decay for highly oriented pyrolytic graphite upon Th70+ impact, the decline is more gradual than for Cs1+ impact, such that at C-16 the relative cluster yield is 1000 times higher.
引用
收藏
页码：297 / 302
页数：6
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