Structural and optical properties of CdTe/MnTe tilted superlattices grown on vicinal surfaces

被引：4
|
作者：
Hartmann, JM
Kany, F
Chautain, F
Rouviere, JL
Wasiela, A
Mariette, H
机构：
[1] CEA Grenoble, Dept Rech Fondamentale Mat Condensee SP2M, CEA, CNRS Grp Microstruct Semicond 2 6, F-38054 Grenoble 9, France
[2] Univ Grenoble 1, CNRS, Spectrometrie Phys Lab, CEA,CNRS Grp Microstruct Semicond 2 6, F-38402 St Martin Dheres, France
来源：
JOURNAL OF CRYSTAL GROWTH | 1998年 / 184卷
关键词：
atomic layer epitaxy; II-VI semiconductors; tilted superlattices; optical anisotropy;
D O I：
10.1016/S0022-0248(98)80059-6
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
We have grown CdTe/MnTe tilted superlattices by atomic layer epitaxy. These heterostructures are formed by depositing, in the step-flow growth mode, fractional monolayer superlattices (CdTe)(m)(MnTe)(n), with p = m + n approximate to 1, onto 2 degrees A and 2 degrees B Cd0.95Zn0.05Te vicinal substrates. Transmission electron microscopy images reveal that we obtain a uniform short-range superlattice period and an in-plane modulation which is approximately 0.1 of that expected for perfect lateral atomic ordering. This reduced lateral modulation is evidenced by polarization anisotropy in optical experiments. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：279 / 282
页数：4
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