Residual Doppler Effect on Electromagnetically Induced Transparency in a Zeeman Sublevel System

被引：0
|
作者：
Hu Zhen-Yan [1 ]
Li Lu-Ming [2 ]
Chen Pei-Rong [2 ]
Sun Xin [2 ]
机构：
[1] Peking Univ, Sch Elect & Comp Sci, Beijing 100871, Peoples R China
[2] Jiangxi Elect Power Informat & Commun Co, Dept Commun, Nanchang 330029, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2010年 / 27卷 / 05期
关键词：
VAPOR; LIGHT;
D O I：
10.1088/0256-307X/27/5/054212
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We investigate the residual Doppler effect on the linewidth of electromagnetically induced transparency (EIT) in a Zeeman sublevel system where a careful experimental design ensures the smallest measurement error. The overall measurement error of the EIT linewidth is estimated to be less than 5%. We present the linear dependence of EIT resonance broadening at small angular deviation in detail. The theoretical analysis exploits the dependence of this feature and shows the qualitative agreement between numerical results and experimental results.
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页数：4
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