Metrology for Measuring Custom Periodicities on Diffraction Gratings

被引:0
|
作者
Zhang, Ningxiao [1 ]
McEntaffer, Randall [1 ]
McCurdy, Ross [1 ]
DeRoo, Casey [1 ]
机构
[1] Penn State Univ, Dept Astron & Astrophys, 525 Davey Lab, University Pk, PA 16802 USA
关键词
Diffraction grating; customized groove patter; period; mapping; metrology; EXTREME-ULTRAVIOLET; EFFICIENCY;
D O I
10.1142/S2251171721500057
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We present a new, inexpensive, bench-top method for measuring groove period over large areas with high mapping resolution and high measurement accuracy, dubbed the grating mapper for accurate period (GMAP). The GMAP has the ability to measure large groove period changes and nonparallel grooves, both of which cannot be measured via optical interferometry. In this paper, we detail the calibration and setup of the GMAP, and employ the instrument to measure three distinct gratings. Two of these measured gratings have customized groove patterns that prevent them from being measured via other traditional methods, such as optical interferometry. Our implementation of this tool achieves a spatial resolution of 0.1 mm x 0.1 mm and a period error of 1.7 nm for a 3 mu m size groove period.
引用
收藏
页数:12
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