Controlled strong excitation of silicon as a step towards processing materials at sub-nanometer precision

被引:30
|
作者
Thanh-Hung Dinh [1 ]
Medvedev, Nikita [2 ,3 ]
Ishino, Masahiko [1 ,4 ]
Kitamura, Toshiyuki [1 ]
Hasegawa, Noboru [1 ]
Otobe, Tomohito [1 ]
Higashiguchi, Takeshi [5 ]
Sakaue, Kazuyuki [6 ,7 ]
Washio, Masakazu [7 ]
Hatano, Tadashi [8 ]
Kon, Akira [9 ,10 ]
Kubota, Yuya [9 ,10 ]
Inubushi, Yuichi [9 ,10 ]
Owada, Shigeki [9 ,10 ]
Shibuya, Tatsunori [11 ]
Ziaja, Beata [12 ,13 ]
Nishikino, Masaharu [1 ,4 ]
机构
[1] Natl Inst Quantum & Radiol Sci & Technol QST, Kansai Photon Sci Inst, 8-1-7 Umemidai, Kizugawa, Kyoto 6190215, Japan
[2] CAS, Inst Phys, Vvi, Na Slovance 2, Prague 18221, Czech Republic
[3] CAS, Inst Plasma Phys, Vvi, Za Slovankou 3, Prague 18200, Czech Republic
[4] QST Adv Study Lab, Grp EUV Ultraprecis Technol, 8-1-7 Umemidai, Kizugawa, Kyoto 6190215, Japan
[5] Utsunomiya Univ, Fac Engn, Dept Elect & Elect Engn, 7-1-2 Yoto, Utsunomiya, Tochigi 3218585, Japan
[6] Univ Tokyo, Photon Sci Ctr, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1138656, Japan
[7] Waseda Univ, Waseda Res Inst Sci & Engn, Shinjuku Ku, 3-4-1 Okubo, Tokyo 1698555, Japan
[8] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Aoba Ku, 2-1-1 Katahira, Sendai, Miyagi 9808577, Japan
[9] Japan Synchrotron Radiat Res Inst, 1-1-1 Kouto, Sayo, Hyogo 6795198, Japan
[10] RIKEN SPring 8 Ctr, 1-1-1 Kouto, Sayo, Hyogo 6795148, Japan
[11] Natl Inst Adv Ind Sci & Technol, NMIJ, Res Inst Measurement & Analyt Instrumentat RIMA, 1-1-1 Umezono, Tsukuba, Ibaraki 3058568, Japan
[12] DESY, Ctr Free Electron Laser Sci CFEL, Notkestr 85, D-22607 Hamburg, Germany
[13] Polish Acad Sci, Inst Nucl Phys, Radzikowskiego 152, PL-31342 Krakow, Poland
关键词
LASER-ABLATION; FEMTOSECOND; THRESHOLDS; ELECTRONS; GROWTH; BEAM;
D O I
10.1038/s42005-019-0253-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Interaction of a solid material with focused, intense pulses of high-energy photons or other particles (such as electrons and ions) creates a strong electronic excitation state within an ultra-short time and on ultra-small spatial scales. This offers the possibility to control the response of a material on a spatial scale less than a nanometer-crucial for the next generation of nano-devices. Here we create craters on the surface of a silicon substrate by focusing single femtosecond extreme ultraviolet pulse from the SACLA free-electron laser. We investigate the resulting surface modification in the vicinity of damage thresholds, establishing a connection to microscopic theoretical approaches, and, with their help, illustrating physical mechanisms for damage creation. The cooling during ablation by means of rapid electron and energy transport can suppress undesired hydrodynamical motions, allowing the silicon material to be directly processed with a precision reaching the observable limitation of an atomic force microscope.
引用
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页数:9
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