Challenges and errors: interpreting high resolution images in scanning tunneling microscopy

被引:145
|
作者
Hofer, WA [1 ]
机构
[1] Univ Liverpool, Surface Sci Res Ctr, Liverpool L69 3BX, Merseyside, England
关键词
scanning tunneling microscopy; first principles simulations; density functional calculations; metal surfaces; semiconductor surfaces; adsorbates on surfaces; magnetic surfaces; adhesion; conductivity; electronic structure;
D O I
10.1016/S0079-6816(03)00005-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
With the availability of first principles methods to simulate the operation of a scanning tunneling microscope (STM) theory has moved from the qualitative and topographic to the quantitative and dynamic. Simulations in effect predict the influence of a model-tip or chemical interactions between tip and sample in the actual imaging process. By comparing experiments and simulations, the information about the analyzed system can be substantially extended. We give an overview of recent work, where the combination of first principles simulations with high resolution measurements was decisive to arrive at consistent results. This concerns the resolution of single wavefunctions by STM, force effects in high resolution scans, contrast reversal due to the field of the tip, the imaging of magnetic properties by spin-polarized STM, and the analysis of dynamic processes on surfaces. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:147 / 183
页数:37
相关论文
共 50 条
  • [31] IMAGES OF CRYSTALLINE ALKANES OBTAINED WITH SCANNING TUNNELING MICROSCOPY
    MICHEL, B
    TRAVAGLINI, G
    ROHRER, H
    JOACHIM, C
    AMREIN, M
    ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1989, 76 (01): : 99 - 105
  • [32] MOLECULAR RESOLUTION IMAGING OF POLYGLUCOSE BY SCANNING TUNNELING MICROSCOPY
    YANG, J
    TAKEYASU, K
    SOMLYO, AP
    SHAO, Z
    FEBS LETTERS, 1991, 279 (02): : 295 - 299
  • [33] Ultrafast scanning tunneling microscopy with 1 nm resolution
    Khusnatdinov, NN
    Nagle, TJ
    Nunes, G
    APPLIED PHYSICS LETTERS, 2000, 77 (26) : 4434 - 4436
  • [34] INFLUENCE OF THE PARAMETERS OF AN EMITTER ON THE RESOLUTION OF SCANNING TUNNELING MICROSCOPY
    ALEKPEROV, SD
    VASILJEV, SI
    MOLCHANOV, SP
    VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 3 FIZIKA ASTRONOMIYA, 1988, 29 (02): : 87 - 89
  • [35] RESOLUTION AND CORRUGATION IN SCANNING TUNNELING MICROSCOPY - THE CASE OF GRAPHITE
    GAUTHIER, S
    ROUSSET, S
    KLEIN, J
    SACKS, W
    BELIN, M
    COMPTES RENDUS DE L ACADEMIE DES SCIENCES SERIE II, 1987, 304 (07): : 265 - 268
  • [36] SCANNING TUNNELING OPTICAL MICROSCOPY - BREAKING A RESOLUTION BARRIER
    WILLIAMSON, RL
    BINKS, CJ
    MILES, MJ
    ULTRAMICROSCOPY, 1995, 57 (2-3) : 235 - 240
  • [37] SAMPLE-DEPENDENT RESOLUTION IN SCANNING TUNNELING MICROSCOPY
    TERSOFF, J
    PHYSICAL REVIEW B, 1989, 39 (02): : 1052 - 1057
  • [38] Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules
    Mohn, Fabian
    Schuler, Bruno
    Gross, Leo
    Meyer, Gerhard
    APPLIED PHYSICS LETTERS, 2013, 102 (07)
  • [39] HIGH-RESOLUTION IMAGING OF PHYSISORBED ORGANIC MONOLAYERS BY SCANNING-TUNNELING-MICROSCOPY
    RICCI, D
    BONFIGLIO, A
    CINCOTTI, S
    DIZITTI, E
    ELEMENTI, L
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 1993, 228 : 475 - 480
  • [40] HIGH-RESOLUTION IMAGING OF COPPER-PHTHALOCYANINE BY SCANNING-TUNNELING MICROSCOPY
    LIPPEL, PH
    WILSON, RJ
    MILLER, MD
    WOLL, C
    CHIANG, S
    PHYSICAL REVIEW LETTERS, 1989, 62 (02) : 171 - 174