An automated system for measuring power devices in Ka-band

被引：3
|
作者：
Bonte, B [1 ]
Gaquiere, C
Bourcier, E
Lemeur, G
Crosnier, Y
机构：
[1] Inst Elect & Microelect Nord, UMR CNRS 9929, Dept Hyperfrequences & Semicond, F-59652 Villeneuve Dascq, France
[2] Thomson RCM, F-78852 Elancourt, France
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1998年 / 46卷 / 01期
关键词：
load-pull; microwave measurements; network testing; transistor;
D O I：
10.1109/22.654924
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
An active load-pull system is presented for measuring devices from 50-mu m to 3-mm gatewidth in Ka-band, It can automatically scan the interesting area of the Smith chart, The system protects the tested devices because the impedance is presented at the output of the device only if the gate current is lower than a fixed value, Results are presented at 30 and 38 GHz on a pseudomorphic high electron-mobility transistor (PM-HEMT).
引用
收藏
页码：70 / 75
页数：6
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