Roughness effects in AFM pull-off force measurements at the nanoscale.

被引：0
|
作者：
Tormoen, GW [1 ]
Drelich, JW [1 ]
机构：
[1] Michigan Technol Univ, Dept Mat Sci & Engn, Houghton, MI 49931 USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 227卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
359-PMSE
引用
收藏
页码：U545 / U545
页数：1
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