Roughness effects in AFM pull-off force measurements at the nanoscale.

被引：0

作者：

Tormoen, GW ^{[1
]}

Drelich, JW ^{[1
]}

机构：

[1] Michigan Technol Univ, Dept Mat Sci & Engn, Houghton, MI 49931 USA

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2004年 / 227卷

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

359-PMSE

引用

页码：U545 / U545

页数：1

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