A parallel algorithm for defect detection of rail and profile in the manufacturing

被引:1
|
作者
Orak, Ilhami Muharrem [1 ]
Celik, Ahmet [2 ]
机构
[1] Karabuk Univ, Muhendislik Fak, Bilgisayar Muhendisligi Bolumu, TR-78050 Karabuk, Turkey
[2] Dumlupinar Univ, Tavsanli Meslek Yuksekokulu, Bilgisayar Teknol Bolumu, TR-43300 Kutahya, Turkey
关键词
Hot rolling processing; defect detection; rail; profile; graphic processor; cuda; parallel processing;
D O I
10.17341/gazimmfd.322168
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Obtaining a result by processing an image via an automatic system may be useful in many fields today. Manufacturing a defective product is an undesired case for manufacturers in many fields. Processing images is an efficient method used to detect defects on images to eliminate the defective products. Since image processing is conducted on pixel basis, it entails great workload. In cases where speed is important in processing, parallel image processing might be a solution. Therefore, processing images in the current multi-core computers by paralleling them with additional hardware and software can boost the performance. The performance in parallel image processing is related to relevance of the algorithm to the parallelism and its accurate distribution to the processors. Common use of the resources and excess of data exchange affect the performance directly. In this study, parallel application of COLMSTD algorithm developed to detect the defects on rail and profile surface during rolling in Kardemir Inc. rolling plant was conducted in two different ways. The 1st method was carried out by selecting the CUDA core numbers in GPU structure by software and the 2nd method was conducted by using single CUDA core. The performance of the results obtained on GPU (Graphics Processing Unit) with the support of CUDA (Compute Unified Device Architecture) interface was compared with that of CPU values.
引用
收藏
页码:439 / 448
页数:10
相关论文
共 50 条
  • [41] Adversarial Defect Detection in Semiconductor Manufacturing Process
    Kim, Jaehoon
    Nam, Yunhyoung
    Kang, Min-Cheol
    Kim, Kihyun
    Hong, Jisuk
    Lee, Sooryong
    Kim, Do-Nyun
    IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2021, 34 (03) : 365 - 371
  • [42] Defect detection of gear parts in virtual manufacturing
    Xu, Zhenxing
    Wang, Aizeng
    Hou, Fei
    Zhao, Gang
    VISUAL COMPUTING FOR INDUSTRY BIOMEDICINE AND ART, 2023, 6 (01)
  • [43] Defect detection technology in metal additive manufacturing
    Guo Z.
    Xiong Z.
    Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology, 2020, 52 (05): : 49 - 57
  • [44] Defect detection of gear parts in virtual manufacturing
    Zhenxing Xu
    Aizeng Wang
    Fei Hou
    Gang Zhao
    Visual Computing for Industry, Biomedicine, and Art, 6
  • [45] Surface Defect Detection Algorithm of Aluminum Profile Based on AM-YOLOv3 Model
    Sun Lianshan
    Wei Jingxue
    Zhu Dengming
    Shi Min
    LASER & OPTOELECTRONICS PROGRESS, 2021, 58 (24)
  • [46] Comparison and Optimization of Rail Defect Detection Methods Based on Object Detection Model
    Zhang, Hongwei
    Cui, Xiaolu
    Yin, Yue
    Tang, Chuanping
    Ding, Haohao
    Zhao, Xiaobo
    Zhong, Jianke
    TRIBOLOGY TRANSACTIONS, 2025, 68 (01) : 171 - 179
  • [47] Rail Defect Detection using Gabor filters with Texture Analysis
    Vijaykumar, V. R.
    Sangamithirai, S.
    2015 3RD INTERNATIONAL CONFERENCE ON SIGNAL PROCESSING, COMMUNICATION AND NETWORKING (ICSCN), 2015,
  • [48] A deep convolutional neural network for detection of rail surface defect
    Yuan, Hao
    Chen, Hao
    Liu, ShiWang
    Lin, Jun
    Luo, Xiao
    2019 IEEE VEHICLE POWER AND PROPULSION CONFERENCE (VPPC), 2019,
  • [49] Rail Defect Detection Method Based on Recurrent Neural Network
    Xu, Qinhua
    Zhao, Qinjun
    Yu, Gang
    Wang, Liguo
    Shen, Tao
    PROCEEDINGS OF THE 39TH CHINESE CONTROL CONFERENCE, 2020, : 6486 - 6490
  • [50] Filter-based feature selection for rail defect detection
    C. Mandriota
    M. Nitti
    N. Ancona
    E. Stella
    A. Distante
    Machine Vision and Applications, 2004, 15 : 179 - 185