Study of photogenerated traps in nanopixels by random telegraph signal and low frequency noise

被引：0
|
作者：
Troudi, M. [1 ]
Sghaier, Na. [1 ,3 ]
Kalboussi, A. [1 ]
Souifi, A. [2 ]
机构：
[1] Fac Sci Monastir, Lab Microelect & Instrumentat, UR 03 13 04, Monastir 5019, Tunisia
[2] Inst Natl Sci Appl, INL, Site INSA UMR 5270, F-69621 Villeurbanne, France
[3] IPEIN, Equipe Composants Elect, UR 99 13 22, Merazka 8000, Nabeul, Tunisia
来源：
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2010年 / 50卷 / 02期
关键词：
SINGLE-ELECTRON TRANSISTOR; QUANTUM-DOT; DETECTOR;
D O I：
10.1051/epjap/2010037
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
In this work, we present noise analysis in a Single Electron Photo-detector (photo-SET or nanopixel) able to detect one by one electron. We perform the power spectral densities (PSD) of random telegraph signals (RTSs) measured in the dark conditions and under light illumination. Photoinduced RTS can be attributed to the charging of a dot near the current path. From these results, photogenerated traps were identified. It is also found that RTS fluctuations depend on the light wavelength.
引用
收藏
页码：203021 / 203025
页数：5
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