Manufacturing system modeling for productivity improvement

被引:59
|
作者
Huang, SH [1 ]
Dismukes, JP
Shi, J
Su, Q
Wang, G
Razzak, MA
Robinson, DE
机构
[1] Univ Cincinnati, Dept Mech Ind & Nucl Engn, Intelligent CAM Syst Lab, Cincinnati, OH 45221 USA
[2] Univ Toledo, Coll Engn, Ctr Mfg Value Chain Sci, Toledo, OH 43606 USA
[3] Pilkington N Amer, Toledo, OH USA
基金
美国国家科学基金会;
关键词
manufacturing system; productivity; modeling; overall equipment effectiveness;
D O I
10.1016/S0278-6125(02)80165-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Competition and the drive for profits are forcing companies to implement various productivity improvement efforts. Implementation of total productive maintenance (TPM) techniques has led to significant productivity improvements for individual equipment, particularly in the semiconductor industry. The productivity improvements achieved at the equipment level are significant but insufficient because what a company really needs is a highly efficient system/factory. This is especially true in the discrete manufacturing industry. In this paper, an approach, based on overall equipment effectiveness (OEE), is developed to model the productivity of a manufacturing system in terms of overall throughput effectiveness (OTE). Sensitivity analysis and theory of constraints are used to help identify productivity improvement opportunities. A real-world case study is presented to illustrate the applicability of the approach.
引用
收藏
页码:249 / 259
页数:11
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