Electron emission characteristics of polycrystalline diamond films

被引:11
|
作者
Sugino, T [1 ]
Kawasaki, S [1 ]
Yokota, Y [1 ]
Iwasaki, Y [1 ]
Shirafuji, J [1 ]
机构
[1] Osaka Univ, Dept Elect Engn, Suita, Osaka 565, Japan
来源
关键词
D O I
10.1116/1.589890
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electron emission characteristics have been investigated for polycrystalline diamond films subjected to H-2 plasma treatment, O-2 plasma treatment, and annealing. In the case of surface treatments of diamond film, the voltage commencing electron emission increases due to O-2 plasma treatment or annealing and is recovered by the subsequent H-2 plasma treatment. On the other hand, in the case when the rear face of the diamond film is treated with O-2 plasma or annealed in diamond/Au samples, no recovery of the voltage occurs due to H-2 plasma treatment after O-2 plasma treatment or annealing. It is suggested that there exists another factor dominating the field emission characteristic other than field emission mechanisms such as electron injection at the diamond/metal contact and electron emission at the surface with negative electron affinity. (C) 1998 American Vacuum Society. [S0734-211X(98)02402-0].
引用
收藏
页码:720 / 723
页数:4
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