Three-dimensional investigation of ceramic/metal heterophase interfaces by atom-probe microscopy

被引：0
|
作者：
Rüsing, J [1 ]
Sebastian, JT [1 ]
Hellman, OC [1 ]
Seidman, DN [1 ]
机构：
[1] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2000年 / 6卷 / 05期
关键词：
heterophase interfaces; MgO/Cu; three-dimensional atom-probe microscopy; interfacial segregation; silver; proxigram; ceramic/metal interfaces;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The results of a three-dimensional atom probe (3DAP) analysis, on a subnanometer scale, of a ceramic/metal heterophase interface, MgO/Cu, are presented. Segregation of Ag, from the Cu (Ag) matrix, at MgO/Cu interfaces is investigated and the Gibbsian interfacial excess of silver is determined; the range is 2.33 x 10(18) to 5.81 x 10(18) m(-2). Also, silver segregation at the same MgO/Cu interfaces is analyzed employing a new approach that utilizes a proximity histogram or proxigram.
引用
收藏
页码：445 / 451
页数：7
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