Three-dimensional nanoanalysis with the tomographic atom-probe

被引:0
|
作者
Blavette, D
Bigot, A
Schmuck, C
Danoix, F
Auger, P
机构
关键词
3D atom-probe; microanalysis; nickel; aluminium; precipitation;
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The tomographic atom-probe is a nanoanalytical instrument which provides three-dimensional maps of chemical heterogeneities in a metallic material on a subnanometric scale. The basic principle of this new generation of apparatus relies on the field evaporation and ionisation of material atoms and the localization of generated ions on a position-sensitive multidetector. Chemical species are identified by time-of-flight mass spectrometry. Local chemical composition in a small selected region of the reconstructed volume (10 x 10 x 1000 nm(3)) may be therefore quantitatively measured. Illustrations of performance of this new generation of apparatus are given (GP zones in Al Cu, precipitation and ordering in two-phase gamma/gamma' NiCrAl single crystal alloys).
引用
收藏
页码:183 / 194
页数:12
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