Characterization of pyramidal inversion boundaries in Sb2O3-doped ZnO by using electron back-scattered diffraction (EBSD)

被引：2
|
作者：
Jo, Wook [1 ]
Park, Chan [1 ]
Kim, Doh-Yeon [1 ]
机构：
[1] Seoul Natl Univ, Dept Mat Sci & Engn, Seoul 151744, South Korea
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2007年 / 63卷
关键词：
D O I：
10.1107/S0108767307000748
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
The composition planes of the inversion boundary induced by the addition of Sb2O3 to ZnO ceramics were analyzed crystallographically by the application of electron back-scattered diffraction (EBSD) analysis and stereographic projection techniques. The inversion boundary was determined to consist of three discrete composition planes, {0001}, {1011}, {10 (1) over bar0}. (c) 2007 International Union of Crystallography Printed in Singapore - all rights reserved.
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页码：229 / 233
页数：5
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