Very high resolution optical transition radiation beam profile monitor

被引：0

作者：

Ross, M ^{[1
]}

Anderson, S ^{[1
]}

Frisch, J ^{[1
]}

Jobe, K ^{[1
]}

McCormick, D ^{[1
]}

McKee, B ^{[1
]}

Nelson, J ^{[1
]}

Smith, T ^{[1
]}

Hayano, H ^{[1
]}

Naito, T ^{[1
]}

Terunuma, N ^{[1
]}

机构：

[1] Stanford Linear Accelerator Ctr, Menlo Pk, CA 94025 USA

来源：

BEAM INSTRUMENTATION WORKSHOP 2002 | 2002年 / 648卷

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have constructed and tested a 2 um resolution beam profile monitor based on optical transition radiation (OTR). Theoretical studies of OTR [1] show that extremely high resolution, of the order of the wavelength of the light detected, is possible. Such high-resolution single pulse profile monitors will be very useful for future free electron laser and linear collider projects. Using the very low emittance 1.3 GeV electron beam at the KEK Accelerator Test Facility (ATF) [2] (1.4nm ex x 15pm ey), we have imaged transition radiation from 5 micron cy beam spots. Our test device consisted of a finely polished target, a thin fused silica window, a 35 mm working distance microscope objective (5x and 10x) and a triggered CCD camera. A wire scanner located near the target is used to verify the profile monitor performance, In this paper we report results of beam tests.

引用

页码：237 / 247

页数：11

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