Gate-voltage dependence of Kondo effect in a triangular quantum dot

被引:4
|
作者
Numata, T. [1 ]
Nisikawa, Y. [1 ]
Oguri, A. [1 ]
Hewson, A. C. [2 ]
机构
[1] Osaka City Univ, Dept Mat Sci, Osaka 5588585, Japan
[2] Imperial Coll, Dept Math, London SW7 2BZ, England
关键词
D O I
10.1088/1742-6596/150/2/022067
中图分类号
O59 [应用物理学];
学科分类号
摘要
We study the conductance through a triangular triple quantum dot, which are connected to two noninteracting leads, using the numerical renormalization group (NRG). It is found that the system shows a variety of Kondo effects depending on the. filling of the triangle. The SU(4) Kondo effect occurs at half-filling, and a sharp conductance dip due to a phase lapse appears in the gate-voltage dependence. Furthermore, when four electrons occupy the three sites on average, a local S = 1 moment, which is caused by the Nagaoka mechanism, is induced along the triangle. The temperature dependence of the entropy and spin susceptibility of the triangle shows that this moment is screened by the conduction electrons via two separate stages at different temperatures. The two-terminal and four-terminal conductances show a clear difference at the gate voltages, where the SU(4) or the S = 1 Kondo effects occurring.
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页数:4
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