Non-contact, Antenna-free Probe for Characterization of THz devices and Components

被引：0
|
作者：
Mingardi, A. [1 ]
Zhang, W-D. [1 ]
Brown, E. R. [1 ]
机构：
[1] Wright State Univ, THz Sensors Lab, Dayton, OH 45435 USA
来源：
PROCEEDINGS OF THE 2016 IEEE NATIONAL AEROSPACE AND ELECTRONICS CONFERENCE (NAECON) AND OHIO INNOVATION SUMMIT (OIS) | 2016年
关键词：
D O I：
暂无
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
This paper presents fabrication and testing of a contact-free, antenna-free probe for characterizing planar semiconducting devices in the THz region.
引用
收藏
页码：441 / 444
页数：4
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