Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

被引：52
|
作者：
Alhadeed, AA [1 ]
Yang, SS
机构：
[1] United Arab Emirates Univ, Dept Stat, Al Ain, U Arab Emirates
[2] Kansas State Univ, Dept Stat, Manhattan, KS 66506 USA
来源：
IEEE TRANSACTIONS ON RELIABILITY | 2005年 / 54卷 / 01期
关键词：
accelerated test; cumulative exposure; log-normal distribution; maximum likelihood estimation; step-stress;
D O I：
10.1109/TR.2004.841704
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail. © 2005 IEEE.
引用
收藏
页码：64 / 68
页数：5
相关论文
共 50 条
  • [21] Optimum log-logistic step-stress model with censoring
    Srivastava, Preeti
    Shukla, Ruchi
    INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2008, 25 (09) : 968 - +
  • [22] Predicting Retweet Scale Using Log-Normal Distribution
    Ding, Hongyi
    Wu, Ji
    2015 1ST IEEE INTERNATIONAL CONFERENCE ON MULTIMEDIA BIG DATA (BIGMM), 2015, : 56 - 63
  • [23] Simple Models Characterizing the Cell Dwell Time with a Log-Normal Distribution
    Sakamoto, Naoshi
    SOFTWARE ENGINEERING, ARTIFICIAL INTELLIGENCE, NETWORKING AND PARALLEL/DISTRIBUTED COMPUTING 2015, 2016, 612 : 115 - 130
  • [24] Simple step-stress model for an extension of the exponential distribution with type-I censoring
    Haghighi, Firoozeh
    INTERNATIONAL JOURNAL OF QUALITY & RELIABILITY MANAGEMENT, 2015, 32 (08) : 906 - 920
  • [25] Optimal Design of Accelerated Life Testing with Multiple Estimation Objectives Using Log-normal Distribution
    Xu Haiyan
    Tang Yincai
    Fei Heliang
    15TH ISSAT INTERNATIONAL CONFERENCE ON RELIABILITY AND QUALITY IN DESIGN, PROCEEDINGS, 2009, : 6 - +
  • [26] Reliability analysis of log-normal distribution with nonconstant parameters under constant-stress model
    Cui, Wei
    Yan, Zai-zai
    Peng, Xiu-yun
    Zhang, Gai-mei
    INTERNATIONAL JOURNAL OF SYSTEM ASSURANCE ENGINEERING AND MANAGEMENT, 2022, 13 (02) : 818 - 831
  • [27] Edge Detection In Mammogram Images Using Log-Normal Distribution
    El-Zaart, Ali
    Al-Jibory, Wafaa Kamel
    2012 2ND INTERNATIONAL CONFERENCE ON ADVANCES IN COMPUTATIONAL TOOLS FOR ENGINEERING APPLICATIONS (ACTEA), 2012, : 301 - 305
  • [28] Optimal design for accelerated life testing with simple step-stress plans
    Hunt, Scott
    Xu, Xiaojian
    International Journal of Performability Engineering, 2012, 8 (05) : 573 - 577
  • [29] Reliability analysis of log-normal distribution with nonconstant parameters under constant-stress model
    Wei Cui
    Zai-zai Yan
    Xiu-yun Peng
    Gai-mei Zhang
    International Journal of System Assurance Engineering and Management, 2022, 13 : 818 - 831
  • [30] Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes
    Tseng, Sheng-Tsaing
    Balakrishnan, Narayanaswamy
    Tsai, Chih-Chun
    IEEE TRANSACTIONS ON RELIABILITY, 2009, 58 (04) : 611 - 618
12345