Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

被引：52
|
作者：
Alhadeed, AA [1 ]
Yang, SS
机构：
[1] United Arab Emirates Univ, Dept Stat, Al Ain, U Arab Emirates
[2] Kansas State Univ, Dept Stat, Manhattan, KS 66506 USA
来源：
IEEE TRANSACTIONS ON RELIABILITY | 2005年 / 54卷 / 01期
关键词：
accelerated test; cumulative exposure; log-normal distribution; maximum likelihood estimation; step-stress;
D O I：
10.1109/TR.2004.841704
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Optimal times of changing stress level for simple step-stress plans under a cumulative exposure model using the log-normal distribution are determined for a wide range of values of the parameters in the model. A table of optimal times of changing stress level for various model parameters values is obtained. A formula for optimal time of changing stress level is also estimated from the table. This paper provides an optimal life testing plan which will enable us to accurately estimate the 50th percentile of the life time of a product being tested without having to wait long time for the product to fail. © 2005 IEEE.
引用
收藏
页码：64 / 68
页数：5
相关论文
共 50 条
12345