Characterization of ZnO Films Prepared by Sol-gel Method

被引：3

作者：

Zhang, Jide ^{[1
]}

Sun, Xin ^{[1
]}

Qi, Tong ^{[1
]}

Ren, Ge ^{[1
]}

Shan, Yingyu ^{[1
]}

Dong, Qingya ^{[1
]}

机构：

[1] Baicheng Normal Univ, Coll Phys & Elect Informat, Baicheng 137000, Peoples R China

来源：

ADVANCES IN MATERIALS, MACHINERY, ELECTRONICS I | 2017年 / 1820卷

关键词：

AIP Proceedings; Title Here; International Conference; Research Center of Engineering and Science; OPTICAL-PROPERTIES;

D O I：

10.1063/1.4977250

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The ZnO thin films were prepared on an ordinary glass substrate using an optimized Sol-gel Method. X-ray diffraction patterns indicated that the grain size increased with increasing annealing temperature. The surface morphology of the films was also analyzed by atomic force microscopy get the same result. The UV-Vis absorption spectra showed that the band edge absorption at the ZnO band edge was strong, and the band gap of the film annealed at 450 degrees C was 3.29eV.

引用

页数：4

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