Optical studies on ZnO films prepared by sol-gel method

被引：11
|
作者：
Ghosh, T. [1 ]
Bandopadhyay, S. [1 ]
Roy, K. K. [1 ]
Maiti, A. K. [2 ]
Goswami, K. [1 ]
机构：
[1] Jadavpur Univ, Dept Phys, Kolkata 700032, India
[2] Bidhannagar Govt Coll, Dept Phys, Kolkata 700064, India
来源：
CRYSTAL RESEARCH AND TECHNOLOGY | 2009年 / 44卷 / 08期
关键词：
zinc oxide; thin film; sol-gel method; optical properties; THIN-FILMS; SPRAY-PYROLYSIS; OXIDE-FILMS; LAYERS; TRANSPARENT; DEPOSITION;
D O I：
10.1002/crat.200800601
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
A standard sol-gel method was used to deposit ZnO thin films of suitable thickness on glass substrate.The optical characteristics of the visible to infrared range on thermal stress were critically observed. Morphological signature of the films was detected by X-ray diffraction (XRD) and the crystallite size determined by Scherrer method from XRD data were consistent with grain size estimated from spectroscopic data through Meulenkamp equation. The optical band gap value from the transmission spectrum was found to corroborate with the existing works. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码：879 / 882
页数：4
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