Time-Resolved X-Ray Microscopy

被引：1
|
作者：
Lider, V. V. [1 ]
机构：
[1] Russian Acad Sci, Shubnikov Inst Crystallog, Fed Sci Res Ctr Crystallog & Photon, Moscow 119333, Russia
来源：
JOURNAL OF SURFACE INVESTIGATION | 2021年 / 15卷 / 01期
关键词：
X-rays; X-ray optics; X-ray microscopy; X-ray tomography; XANES; X-ray fluorescence; in situ; in operando; IN-SITU; SYNCHROTRON-RADIATION; ZONE PLATES; FLUORESCENCE; LI; DYNAMICS; ENERGY; VISUALIZATION; EVOLUTION; SPECTROMICROSCOPY;
D O I：
10.1134/S1027451021010092
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The review is devoted to time-resolved X-ray microscopy, which is designed to obtain an image of an object under study in real space in two or three dimensions using elements of focusing optics. A full-field X-ray microscope and a scanning X-ray microscope are described, and the possibilities of their use together with the methods of X-ray absorption near edge structure (XANES) and X-ray fluorescence for studying time-dependent processes in condensed media are considered.
引用
收藏
页码：28 / 38
页数：11
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