Time-Resolved X-Ray Scattering

被引：2

作者：

Schick, Daniel ^{[1
]}

Schmising, Clemens von Korff ^{[2
]}

Bojahr, Andre ^{[1
]}

Kiel, Mareike ^{[1
]}

Gaal, Peter ^{[1
]}

Bargheer, Matias ^{[1
]}

机构：

[1] Univ Potsdam, Inst Phys & Astron, Karl Liebknecht Str 24-25, D-14476 Potsdam, Germany

[2] Lund Univ, Dept Phys, Atom Phys Divis, SE-22100 Lund, Sweden

来源：

ULTRAFAST PHENOMENA IN SEMICONDUCTORS AND NANOSTRUCTURE MATERIALS XV | 2011年 / 7937卷

关键词：

ultrafast x-ray diffraction; DIFFRACTION;

D O I：

10.1117/12.877147

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Ultrafast x-ray diffraction (UXRD) has become more and more prevalent in various scientific disciplines that are interested in directly observing atomic motion in real time. The timescale, amplitude and phase of collective atomic motion can be determined with high accuracy, even when the induced amplitude is smaller than thermal fluctuations. The structural rearrangements induced by an ultrafast stimulus (charge carriers excitation or heat deposition by a laser pulse) can be recorded in real time. Here we report on a new laser-driven plasma-x-ray source (PXS) and discuss different applications which will be addressed in UXRD experiments.

引用

页数：10

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