Surface micromorphology of CdTe(310) layers grown by molecular beam epitaxy

被引：3
|
作者：
Yakushev, M. V. [1 ]
Brunev, D. V. [1 ]
Sidorov, Yu. G. [1 ]
机构：
[1] Russian Acad Sci, Inst Semicond Phys, Novosibirsk, Russia
来源：
JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2010年 / 4卷 / 01期
关键词：
ENERGY; DEFECTS;
D O I：
10.1134/S1027451010010106
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
Surface morphology of CdTe(310) buffer layers grown by molecular beam epitaxy has been investigated by the method of reflection of high-energy electron diffraction. It was established that a clean CdTe(310) surface is atomically flat. Its reconstruction can be described by a unit cell coinciding with the unit cell of the unreconstructed (310) surface. It is determined that Te(2) adsorption in amounts of less than 0.2 monolayers results in the surface reconstruction with the formation of terraces parallel to the (100) plane and are 3/2a long. A system of (100) + (210) facets develops on the CdTe(310) surface with the increase in the Te adsorption layer's thickness up to 0.3 monolayers and more.
引用
收藏
页码：64 / 70
页数：7
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