Metric learning by similarity network for deep semi-supervised learning

被引:0
|
作者
Wu, Sanyou [1 ]
Feng, Xingdong [1 ]
Zhou, Fan [1 ]
机构
[1] Shanghai Univ Finance & Econ, Sch Stat & Management, Shanghai 200433, Peoples R China
关键词
Similarity Network; Metric Learning; Weak Labels; Semi-Supervised Learning; Mean-Teacher;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Deep semi-supervised learning has been widely implemented in the real-world due to the rapid development of deep learning. Recently, attention has shifted to the approaches such as Mean-Teacher to penalize the inconsistency between two perturbed input sets. Although these methods may achieve positive results, they ignore the relationship information between data instances. To solve this problem, we propose a novel method named Metric Learning by Similarity Network (MLSN), which aims to learn a distance metric adaptively on different domains. By co-training with the classification network, similarity network can learn more information about pairwise relationships and performs better on some empirical tasks than state-of-art methods.
引用
收藏
页码:995 / 1002
页数:8
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