Spectroscopic study of nanocrystalline V2O5•nH2O films doped with Li ions

被引:26
|
作者
Al-Assiri, M. S. [2 ]
El-Desoky, M. M. [2 ,3 ]
Alyamani, A. [4 ]
Al-Hajry, A. [2 ]
Al-Mogeeth, A. [2 ]
Bahgat, A. A. [1 ,2 ]
机构
[1] Al Azhar Univ, Fac Sci, Dept Phys, Cairo 11884, Egypt
[2] King Khalid Univ, Coll Sci, Dept Phys, Abha, Saudi Arabia
[3] Suez Canal Univ, Fac Educ, Dept Phys, Al Arish, Egypt
[4] Natl Ctr Math & Phys, Riyadh 11442, Saudi Arabia
来源
OPTICS AND LASER TECHNOLOGY | 2010年 / 42卷 / 06期
关键词
Vanadium pentoxide; Nanocrystalline films; Refractive index; VANADIUM PENTOXIDE; OPTICAL-PROPERTIES; XEROGEL; GEL;
D O I
10.1016/j.optlastec.2010.01.020
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical properties of nanocrystalline, LixV2O5 center dot nH(2)O films (0<x<22 mol%), are explored in the present work. These films have been produced by the sol-gel technique (colloidal route), which was used for the preparation of high purity and homogeneity films. Optical measurements were carried out using a double-beam spectrophotometer. The optical constants such as refractive index n, the extinction coefficient k, absorption coefficient a, and optical band gap of the films material have been evaluated. The optical absorption coefficient was calculated from the measured normal reflectance, R, and transmittance, T, spectra. The optical spectra of all samples exhibited two distinct regions: at high energy, which suggests a direct forbidden transition with optical gap ranging from 1.75 to 2.0 eV and increases with increase in Li-content. On the other hand a second low-energy band suggests a direct allowed transition with optical gap ranging from 0.40 to 0.42 eV. The width of the localized states (band tail) E-e was also estimated for all samples. Additional calculations applying the real part of the optical dielectric function led to the evaluation of the charge carrier concentration and their effective mass. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:994 / 1003
页数:10
相关论文
共 50 条
  • [31] Dielectric function of V2O5 nanocrystalline films by spectroscopic ellipsometry:: Characterization of microstructure
    Losurdo, M
    Bruno, G
    Barreca, D
    Tondello, E
    APPLIED PHYSICS LETTERS, 2000, 77 (08) : 1129 - 1131
  • [32] Synthesis and Electrochromic Characterization of the Graphene/Poly(ethylene oxide)/V2O5 • nH2O Ternary Nanocomposite Films
    Jiang, ShanShan
    Li, Zhaolong
    Huang, Shengnan
    Lu, Shan
    Yu, Yue
    Mou, Guangying
    Xu, Jie
    Zhu, Quanyao
    Tan, Xi
    Zhu, XiangLe
    Zakharova, Galina S.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2014, 161 (10) : H684 - H688
  • [33] Nano-Crystal V2O5 nH2O Sol-Gel Films Made by Dip Coating
    Ozdemir, Orhan
    Gokdemir, F. Pinar
    Menda, U. Deneb
    Kavak, Pelin
    Saatci, A. Evrim
    Kutlu, Kubilay
    2ND INTERNATIONAL ADVANCES IN APPLIED PHYSICS AND MATERIALS SCIENCE CONGRESS, 2012, 1476 : 233 - 240
  • [34] The characterization of nanocrystalline V2O5 and mixed V2O5/Ce oxide
    Orel, ZC
    Kuscer, D
    Kosec, M
    Turkovic, A
    SURFACE AND COLLOID SCIENCE, 2004, 128 : 120 - 125
  • [35] XPS study of nanorods of doped vanadium oxide M x V2O5 • nH2O (M = Na, K, Rb, Cs)
    Zakharova, G. S.
    Podval'naya, N. V.
    Kuznetsov, M. V.
    RUSSIAN JOURNAL OF INORGANIC CHEMISTRY, 2011, 56 (02) : 267 - 272
  • [36] Structure of V2O5•nH2O xerogel solved by the atomic pair distribution function technique
    Petkov, V
    Trikalitis, PN
    Bozin, ES
    Billinge, SJL
    Vogt, T
    Kanatzidis, MG
    JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (34) : 10157 - 10162
  • [37] Thermogravimetry and X-ray absorption spectroscopy study of heated V2O5•nH2O aerogels and ambigels
    Mansour, AN
    Dallek, S
    Smith, PH
    Baker, WM
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2002, 149 (12) : A1589 - A1597
  • [38] Nanostructured V2O5•nH2O/cup-stacked carbon nanotube composite with remarkable Li+ specific capacity
    de Freitas Neto, D. B.
    Parmar, Rahul
    Matsubara, E. Y.
    Minicucci, M.
    Gunnella, R.
    Rosolen, J. M.
    SOLID STATE IONICS, 2021, 363
  • [39] Raman spectroscopic characterization of the microstructure of V2O5 films
    Su, Q.
    Liu, X. Q.
    Ma, H. L.
    Guo, Y. P.
    Wang, Y. Y.
    JOURNAL OF SOLID STATE ELECTROCHEMISTRY, 2008, 12 (7-8) : 919 - 923
  • [40] Raman spectroscopic characterization of the microstructure of V2O5 films
    Q. Su
    X. Q. Liu
    H. L. Ma
    Y. P. Guo
    Y. Y. Wang
    Journal of Solid State Electrochemistry, 2008, 12 : 919 - 923