Structured illumination microscopy and image scanning microscopy: a review and comparison of imaging properties

被引：12
|
作者：
Sheppard, Colin J. R. [1 ,2 ,3 ]
机构：
[1] Ist Italiano Tecnol, Nanoscopy, Via Enrico Melen,83 Edificio B, I-16152 Genoa, Italy
[2] Ist Italiano Tecnol, NIC IIT, Via Enrico Melen,83 Edificio B, I-16152 Genoa, Italy
[3] Univ Wollongong, Sch Chem & Mol Biol, Mol Horizons, Wollongong, NSW 2522, Australia
来源：
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 2021年 / 379卷 / 2199期
关键词：
structured illumination microscopy; image scanning microscopy; spatial resolution; confocal microscopy; optics; computational reconstruction; FLUORESCENCE MICROSCOPY; LIGHT-MICROSCOPY; SUPER-RESOLUTION; OPTICAL TRANSFER; SUPERRESOLUTION; EXCITATION; LIMIT; FIELD; ENHANCEMENT; IMPROVEMENT;
D O I：
10.1098/rsta.2020.0154
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
Structured illumination microscopy and image scanning microscopy are two microscopical tech- niques, rapidly increasing in practical application, that can result in improvement in transverse spatial resolution, and/or improvement in axial imaging performance. The history and principles of these techniques are reviewed, and the imaging properties of the two methods compared. This article is part of the Theo Murphy meeting issue 'Super-resolution structured illumination microscopy (part 1)'.
引用
收藏
页数：15
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