Luminescence and superradiance in electron-beam-excited AlxGa1-xN

被引:14
|
作者
Bokhan, P. A. [1 ]
Gugin, P. P. [1 ]
Zakrevsky, Dm. E. [1 ]
Zhuravlev, K. S. [1 ,2 ]
Malin, T. V. [1 ]
Osinnykh, I. V. [1 ,2 ]
Solomonov, V. I. [3 ]
Spirina, A. V. [3 ]
机构
[1] Russian Acad Sci, Siberian Branch, Rzhanov Inst Semicond Phys, Novosibirsk 630090, Russia
[2] Novosibirsk State Univ, Novosibirsk 630090, Russia
[3] Russian Acad Sci, Ural Div, Inst Electrophys, Ekaterinburg 620016, Russia
关键词
BAND-GAP; LIGHT-EMISSION; LASER-DIODES; ALN; AL(X)GA1-XN; EPITAXY; DEVICES; ALLOYS;
D O I
10.1063/1.4894774
中图分类号
O59 [应用物理学];
学科分类号
摘要
Luminescence and superradiance characteristics of 0.5-1.2-mu m thick AlxGa1-xN films grown by molecular-beam epitaxy on sapphire substrates were studied under excitation of the films with low-energy (<20 keV) and high-energy (170 keV) electron beams. In both cases, the luminescence spectra looked quite similarly; they exhibited a band-edge luminescence with x-dependent wavelength ranging from 365 nm to 310 nm and a broadband emission taking over the whole visible spectral region. Superradiance within the broad band was obtained by pumping the samples with powerful an electron beam in the form of an open-discharge-generated filament. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:6
相关论文
共 50 条
  • [31] N-VACANCIES IN ALXGA1-XN
    JENKINS, DW
    DOW, JD
    TSAI, MH
    JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) : 4130 - 4133
  • [32] AlxGa1-xN based materials and heterostructures
    Kung, P
    Saxler, A
    Walker, D
    Zhang, X
    Lavado, R
    Kim, KS
    Razeghi, M
    III-V NITRIDES, 1997, 449 : 79 - 84
  • [33] Analysis of composition fluctuations in AlxGa1-xN
    Lab. für Elektronenmikroskopie, Univ. Karlsruhe, K., Karlsruhe, Germany
    不详
    不详
    Mater Sci Eng B Solid State Adv Technol, 1-3 (182-185):
  • [34] Analysis of composition fluctuations in AlxGa1-xN
    Neubauer, B
    Rosenauer, A
    Gerthsen, D
    Ambacher, O
    Stutzmann, M
    Albrecht, M
    Strunk, HP
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 59 (1-3): : 182 - 185
  • [35] Problems with cracking of AlxGa1-xN layers
    Dumiszewska, E
    Lenkiewicz, D
    Strupinski, W
    Jasik, A
    Jakiela, RS
    Wesolowski, M
    OPTICA APPLICATA, 2005, 35 (01) : 111 - 115
  • [36] MOVPE growth and characterization of AlxGa1-xN
    Ruffenach-Clur, S
    Briot, O
    Rouviere, JL
    Gil, B
    Aulombard, RL
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1997, 50 (1-3): : 219 - 222
  • [37] Theoretical study of the AlxGa1-xN alloys
    de Paiva, R
    Alves, JLA
    Nogueira, RA
    de Oliveira, C
    Alves, HWL
    Scolfaro, LMR
    Leite, JR
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2002, 93 (1-3): : 2 - 5
  • [38] Critical issues in AlxGa1-xN growth
    Amano, H
    Akasaki, I
    OPTICAL MATERIALS, 2002, 19 (01) : 219 - 222
  • [39] Optical properties of AlxGa1-xN alloy
    Takeuchi, Katsuki
    Adachi, Sadao
    Ohtsuka, Kohji
    JOURNAL OF APPLIED PHYSICS, 2010, 107 (02)
  • [40] Raman analysis of AlxGa1-xN films
    Bergman, L
    Dutta, M
    Bremser, MD
    Nam, OH
    Perry, WG
    Alexon, D
    Davis, RF
    Balkas, CM
    Nemanich, RJ
    NITRIDE SEMICONDUCTORS, 1998, 482 : 543 - 548